Analysis and simulation of the frequency response of MOSFETs with uniform and/or local oxide degradation
β Scribed by H. Haddara; S. Bassiouni; H.F. Ragaie
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 811 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0038-1101
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