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Analysis and experimental verification of digital substrate noise generation for epi-type substrates

✍ Scribed by van Heijningen, M.; Compiet, J.; Wambacq, P.; Donnay, S.; Engels, M.G.E.; Bolsens, I.

Book ID: 119775603
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 144 KB
Volume: 35
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.848209

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