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Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

✍ Scribed by Badaroglu, M.; Donnay, S.; De Man, H.J.; Zinzius, Y.A.; Gielen, G.G.E.; Sansen, W.; Fonden, T.; Signell, S.


Book ID
119799163
Publisher
IEEE
Year
2003
Tongue
English
Weight
805 KB
Volume
38
Category
Article
ISSN
0018-9200

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