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An X-ray diffraction study on the microstructure of vapour-deposited fcc lead films: normal and oblique incidences

Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
165 KB
Volume
30
Category
Article
ISSN
0042-207X

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An X-ray diffraction profile study in si
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๐Ÿ“‚ Article ๐Ÿ“… 1978 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 162 KB

permeates helium contained in analysed probes. It is found that the coefficient of trapping He ions in the pump is 0.76 f 30% and it does not deoend on discharge voltage in the range 0.9 to 3.3 kV. The life of the indicator is lo4 &alysesat a sensitivity of 5 x 10-r" A/torr.