4078. An X-ray diffraction study on the lattice imperfections in vapour-deposited fcc (Ag-4.5 at % Ge) alloy films. (GB)

An X-ray diffraction profile study in si

An X-ray diffraction profile study in silver films vapour-deposited on a rotating substrate with the axial centre at 44° to the vapour direction

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 162 KB

permeates helium contained in analysed probes. It is found that the coefficient of trapping He ions in the pump is 0.76 f 30% and it does not deoend on discharge voltage in the range 0.9 to 3.3 kV. The life of the indicator is lo4 &alysesat a sensitivity of 5 x 10-r" A/torr.