๐”– Bobbio Scriptorium
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An optical scanning system for semiconductor junction examination

โœ Scribed by A. Singmin

Book ID
103276618
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
462 KB
Volume
17
Category
Article
ISSN
0026-2714

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to determine the non-linear optical carried out by scanning a sample Traditional z-scan techniques have been used coefficients of semiconductors. This is usually along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a