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Fastscan z-scan system for determining optical non-linearities in semiconductors

✍ Scribed by I.J. Blewett; J. Stokes; A. Tookey; A.K. Kar; B.S. Wherrett

Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
387 KB
Volume
29
Category
Article
ISSN
0030-3992

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✦ Synopsis

to determine the non-linear optical carried out by scanning a sample Traditional z-scan techniques have been used coefficients of semiconductors. This is usually along the optical z-axis using a manual or computer-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sampleholder: This gives real-time z-scan traces and greatly improves experimental efficiency and applicability.

The technique is used here to study the two-photon absorption coefficient of ZnSe.

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