๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

An examination of the electronic structure of SiO by soft x-ray emission spectroscopy

โœ Scribed by Tom Scimeca

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
248 KB
Volume
77
Category
Article
ISSN
0038-1098

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Investigation of an Mo/SiO2 interface by
Investigation of an Mo/SiO2 interface by electron-induced x-ray emission spectroscopy
โœ Jonnard, P.; Bonnelle, C.; Bosseboeuf, A.; Danaie, K.; Beauprez, E. ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 89 KB ๐Ÿ‘ 1 views

We have studied the solid/solid interface between Mo and SiO 2 films deposited, respectively, by magnetron d.c. sputtering and plasma-enhanced chemical vapour deposition (PECVD). The sample depth profile was characterized by SIMS. We used electron-induced x-ray emission spectroscopy to characterize

Investigation of the electronic structur
Investigation of the electronic structure of paradichlorobenzene using x-ray emission spectroscopy
โœ E. Gilberg ๐Ÿ“‚ Article ๐Ÿ“… 1977 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 338 KB

The Cl Kp emission spectra from disordered and ordered molecules of paradichlorobenzene were recorded using a highresolution curved crystal spectrograph. It was possible to separate the component polarized perpendicularly to the molecular plane from the in-plane poiarized radiation\_ Thus informatio