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An energy and intensity monitor for X-ray absorption near-edge structure measurements

✍ Scribed by Martin D. de Jonge; David Paterson; Ian McNulty; Christoph Rau; Jay A. Brandes; Ellery Ingall

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
307 KB
Volume
619
Category
Article
ISSN
0168-9002

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