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An empirical relation for semiconductor strained-layer relaxation

✍ Scribed by Brian W. Dodson

Book ID: 107790072
Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 249 KB
Volume: 91
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(88)90135-2

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