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An application of gold diffusion for defect investigation in silicon

✍ Scribed by O.V. Feklisova; E.B. Yakimov

Book ID: 103887837
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 283 KB
Volume: 404
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2009.08.313

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