𝔖 Bobbio Scriptorium

✦ LIBER ✦

Alternative route for studying the grain boundary scattering in semiconductor films of high resistivity

✍ Scribed by D Bhattacharyya; S Chaudhuri; AK Pal

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 670 KB
Volume: 44
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(93)90309-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The use of ion scattering for the study

The use of ion scattering for the study of radiation damage in metals and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardment induced surface damage

✍ DG Armour 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 62 KB

The use og ion scattering for the study

The use og ion scattering for the study of radiation damage in metal and semiconductors: I. High energy scattering studies. II. Low energy scattering studies of ion bombardent induced surface damage: D G Armour, Vacuum, 32 (9), 1982, 573

📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 291 KB