AlGaN/GaN HEMT device reliability and degradation evolution: Importance of diffusion processes

✍ Scribed by Martin Kuball; Milan Ťapajna; Richard J.T. Simms; Mustapha Faqir; Umesh K. Mishra

• Book ID: 108210910
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 732 KB
• Volume: 51
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2010.08.014