✦ LIBER ✦
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems
✍ Scribed by M. Dammann; W. Pletschen; P. Waltereit; W. Bronner; R. Quay; S. Müller; M. Mikulla; O. Ambacher; P.J. van der Wel; S. Murad; T. Rödle; R. Behtash; F. Bourgeois; K. Riepe; M. Fagerlind; E.Ö. Sveinbjörnsson
- Book ID
- 108210801
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 523 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0026-2714
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