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AIP Conference Proceedings [AIP 2010 WIDE BANDGAP CUBIC SEMICONDUCTORS: FROM GROWTH TO DEVICES: Proceedings of the E-MRS Symposium∗ F∗ - Strasbourg, (France) (8–10 October 2010)] - Impact of nonintentional Al impurity to carrier lifetime and diffusion in sublimation grown 3C heterostructures

✍ Scribed by Ščajev, P.; Jarašiūnas, K.; Kadys, A.; Storasta, J.; Abramov, P. L.; Lebedev, S. P.; Lebedev, A. A.; Ferro, Gabriel; Siffert, Paul

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