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AIP Conference Proceedings [AIP 2010 WIDE BANDGAP CUBIC SEMICONDUCTORS: FROM GROWTH TO DEVICES: Proceedings of the E-MRS Symposium∗ F∗ - Strasbourg, (France) (8–10 October 2010)] - Study of the Stability of 3C-SiC Single Crystals Using High-Resolution Diffuse X-Ray Scattering

✍ Scribed by Dompoint, D.; Boulle, A.; Galben-Sandulache, I. G.; Chaussende, D.; Ferro, Gabriel; Siffert, Paul

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