✦ LIBER ✦

AES depth profiling of electrochemically grown γ-FeOOH

✍ Scribed by Silvia Ardizzone; Leonardo Formaro

Publisher: Elsevier Science
Year: 1988
Weight: 595 KB
Volume: 246
Category: Article
ISSN: 0022-0728
DOI: 10.1016/0022-0728(88)85050-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

AES Depth Profiling of Nitrogen Implante

AES Depth Profiling of Nitrogen Implanted Fe(001)

✍ Dr. Josef Zemek; Ing. Le Van Phac; Ing. Jaroslav Král 📂 Article 📅 1986 🏛 John Wiley and Sons 🌐 English ⚖ 379 KB

Comparison of rotational depth profiling

Comparison of rotational depth profiling with AES and XPS

✍ A. Zalar; S. Hofmann 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 475 KB

Depth profiling of microelectronic struc

Depth profiling of microelectronic structures by SIMS and AES

✍ M Maier 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 374 KB

Optimized linear decomposition of data o

Optimized linear decomposition of data obtained during AES depth profiling

✍ J. Kovač; T. Bogataj; A. Zalar 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 98 KB

AES depth profiling and interface analys

AES depth profiling and interface analysis of C/Ta bilayers

✍ A. Zalar; J. Kovač; B. Praček; S. Hofmann; P. Panjan 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 276 KB

AES depth profiling of passive overlayer

AES depth profiling of passive overlayers formed on nickel alloys

✍ G. Lorang; N. Jallerat; K. Vu Quang; J.-P. Langeron 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 659 KB

## Abstract Depth profiling analysis of passive films grown on the surface of two nickel‐based alloys (Inconel 600 and Hastelloy C4) in NaCl media was carried out using Auger electron spectroscopy (AES) and ion sputtering. Improvement to the sequential sputtering model of Hofmann (1976) should be p