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Advanced thin film technology for ultrahigh resolution X-ray microscopy

✍ Scribed by Joan Vila-Comamala; Konstantins Jefimovs; Jörg Raabe; Tero Pilvi; Rainer H. Fink; Mathias Senoner; Andre Maaßdorf; Mikko Ritala; Christian David


Book ID
108291796
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
487 KB
Volume
109
Category
Article
ISSN
0304-3991

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