✦ LIBER ✦

Adsorption-ellipsometry method of studying the optical profile, thickness, and porosity of thin films

✍ Scribed by Tolmachev, V. A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Study of the optical properties of anthr

✍ Elsharkawi, A. R.; Kao, K. C. 📂 Article 📅 1975 🏛 Optical Society of America ⚖ 740 KB

Ellipsometry measurement of the complex

✍ Ho, Jau Hwang; Len Lee, Chung; Lei, Tan Fu; Chao, Tien Sheng 📂 Article 📅 1990 🏛 Optical Society of America 🌐 English ⚖ 1006 KB

Determination of the optical constants a

✍ T.F. Thonn; R.M.A. Azzam 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 355 KB

On the Calculation of Thin Film Refracti

✍ Holmes, D. A. 📂 Article 📅 1967 🏛 The Optical Society 🌐 English ⚖ 617 KB

Simultaneous and Independent Determinati

✍ VEDAM, K.; RAI, R.; LUKES, F.; SRINIVASAN, R. 📂 Article 📅 1968 🏛 Optical Society of America ⚖ 771 KB

Measuring the Refractive Index and Thick

✍ Daneu, V. ;Sanchez, A. 📂 Article 📅 1974 🏛 The Optical Society 🌐 English ⚖ 951 KB