๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Addenda to photoluminescence and electron paramagnetic resonance studies of defect centers in porous silicon

โœ Scribed by H.T. Lue; C.Y. Tseng; J.T. Lue

Book ID
114192769
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
73 KB
Volume
73
Category
Article
ISSN
0254-0584

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Defect Structure of Nitrogen Plasma Trea
Defect Structure of Nitrogen Plasma Treated Porous Silicon Studied Using Electron Paramagnetic Resonance
โœ Ehara, T. ;Arai, T. ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 118 KB ๐Ÿ‘ 1 views

We describe the defect properties in nitrogen plasma treated porous silicon (PS) studied using electron paramagnetic resonance (EPR). We consider the dependence of the paramagnetic properties of the defects on the structure of PS. The nitrogen plasma treatment changed the structure of PS. After the