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Acoustic Microscopy Applied to SAW Dispersion and Film Thickness Measurement

✍ Scribed by Weglein, R.D.

Book ID: 114597086
Publisher: Institute of Electrical and Electronics Engineers
Year: 1980
Weight: 440 KB
Volume: 27
Category: Article
ISSN: 0018-9537
DOI: 10.1109/t-su.1980.31152

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