✦ LIBER ✦
Ellipsometry as applied to the measurement of the thicknesses and indices of oxide films on silicon : Ph. Bied-Charreton. Rev. Tech. Thomson-CSF3, No. 4, December (1971), p. 679. (In French.)
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 104 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0026-2714
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