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[ACM Press the 21st edition of the great lakes symposium - Lausanne, Switzerland (2011.05.02-2011.05.04)] Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI - GLSVLSI '11 - Evaluation of FPGA routing architectures under process variation

โœ Scribed by Pourhashemi, Fatemeh Sadat; Saheb Zamani, Morteza


Book ID
125440209
Publisher
ACM Press
Year
2011
Weight
450 KB
Category
Article
ISBN
1450306675

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[ACM Press the 21st edition of the great
โœ Firouzi, Farshad; Kiamehr, Saman; Tahoori, Mehdi B. ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› ACM Press โš– 500 KB

Transistor aging is a serious reliability challenge for nanoscale CMOS technology which can significantly reduce the operation lifetime of VLSI chips. Negative Bias Temperature Instability (NBTI) is the major contributor to transistor aging which affect PMOS transistors. The input vectors applied to