[ACM Press the 21st edition of the great
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Firouzi, Farshad; Kiamehr, Saman; Tahoori, Mehdi B.
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Article
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2011
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ACM Press
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Transistor aging is a serious reliability challenge for nanoscale CMOS technology which can significantly reduce the operation lifetime of VLSI chips. Negative Bias Temperature Instability (NBTI) is the major contributor to transistor aging which affect PMOS transistors. The input vectors applied to