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[ACM Press the 21st edition of the great lakes symposium - Lausanne, Switzerland (2011.05.02-2011.05.04)] Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI - GLSVLSI '11 - FPGA implementation of binary edwards curve usingternary representation

โœ Scribed by Chatterjee, Ayantika; Sengupta, Indranil


Book ID
115532961
Publisher
ACM Press
Year
2011
Weight
606 KB
Volume
0
Category
Article
ISBN
1450306675

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[ACM Press the 21st edition of the great
โœ Firouzi, Farshad; Kiamehr, Saman; Tahoori, Mehdi B. ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› ACM Press โš– 500 KB

Transistor aging is a serious reliability challenge for nanoscale CMOS technology which can significantly reduce the operation lifetime of VLSI chips. Negative Bias Temperature Instability (NBTI) is the major contributor to transistor aging which affect PMOS transistors. The input vectors applied to