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Achieving a low interfacial density of states in atomic layer deposited Al2O3 on In0.53Ga0.47As

โœ Scribed by Chiu, H. C.; Tung, L. T.; Chang, Y. H.; Lee, Y. J.; Chang, C. C.; Kwo, J.; Hong, M.


Book ID
118123558
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
658 KB
Volume
93
Category
Article
ISSN
0003-6951

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Low interfacial density of states around
โœ C.A. Lin; H.C. Chiu; T.H. Chiang; Y.C. Chang; T.D. Lin; J. Kwo; W.-E. Wang; J. D ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 693 KB

Systematic temperature-dependent capacitance-voltage and conductance measurements were used to study the electrical characteristics of molecular beam epitaxy (MBE) and atomic layer deposition (ALD) oxides on In 0.2 Ga 0.8 As/GaAs. The distribution of interfacial density of states (D it ) within the