A software tool (''Ionshaper TM '') has been developed which allows calibrated high precision simulation of ion beam processing. The continuum model is based on a discrete surface element approach that includes first and second-order sputtering and re-deposition in 2D. Atomistic effects are implicit
โฆ LIBER โฆ
Accurate parameter extraction for the simulation of direct structuring by ion beams
โ Scribed by S. Beuer; M. Rommel; Ch. Lehrer; E. Platzgummer; S. Kvasnica; A.J. Bauer; H. Ryssel
- Book ID
- 108207701
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 671 KB
- Volume
- 84
- Category
- Article
- ISSN
- 0167-9317
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