Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement

✍ Scribed by Hong, Y.D.; Yew Tong Yeow; Chim, W.K.; Jian Yan; Kin Mun Wong

• Book ID: 114618132
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 477 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2005.864367