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AC hot-carrier degradation due to gate-pulse-induced noise

✍ Scribed by Ryuichi Izawa; Kazunori Umeda; Eiji Takeda

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ R. Ghodsi; Y.T. Yeow 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 535 KB

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✍ Quon, D.; Gopi, P.K.; Sonek, G.J.; Li, G.P. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 746 KB