Absorption and phase X-ray imaging using reflected beam
β Scribed by Jan Jakubek
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 551 KB
- Volume
- 633
- Category
- Article
- ISSN
- 0168-9002
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Near surface layers structure data as r, N, a, AEo and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 -~ -i/3 for each layer can be calculated. The application of the Fresnel t
## Abstract In this study, we visualized the internal structures of various bioβsamples and found the optimum conditions of test samples for the 7 keV hard Xβray microscope of the Pohang light source. From the captured Xβray images, we could observe the intercellular and intracellular structures of