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A Yield Model for Integrated Circuits and its Application to Statistical Timing Analysis

โœ Scribed by Farid N. Najm; Noel Menezes; Imad A. Ferzli

Book ID
117907780
Publisher
IEEE
Year
2007
Tongue
English
Weight
875 KB
Volume
26
Category
Article
ISSN
0278-0070

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