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A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits

✍ Scribed by Mani, M.; Devgan, A.; Orshansky, M.; Yaping Zhan


Book ID
117907907
Publisher
IEEE
Year
2007
Tongue
English
Weight
593 KB
Volume
26
Category
Article
ISSN
0278-0070

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