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A wide-band on-wafer noise parameter measurement system at 50-75 GHz

โœ Scribed by Kantanen, M.; Lahdes, M.; Vaha-Heikkila, T.; Tuovinen, J.


Book ID
111983244
Publisher
IEEE
Year
2003
Tongue
English
Weight
427 KB
Volume
51
Category
Article
ISSN
0018-9480

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