Improved Y-factor method for wide-band on-wafer noise-parameter measurements

✍ Scribed by Tiemeijer, L.F.; Havens, R.J.; de Kort, R.; Scholten, A.J.

• Book ID: 114660365
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 467 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.2005.854243