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A versatile built-in CMOS sensing device for digital circuit parametric test

✍ Scribed by Dragic, M.S.; Margala, M.

Book ID: 114629450
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 720 KB
Volume: 52
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2003.818725

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