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A unified statistical approach to recombination-generation noise in semiconductors

✍ Scribed by P.T. Landsberg; D.A. Evans

Publisher: Elsevier Science
Year: 1961
Tongue: English
Weight: 460 KB
Volume: 22
Category: Article
ISSN: 0022-3697
DOI: 10.1016/0022-3697(61)90285-2

No coin nor oath required. For personal study only.

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