Noise in the quantum efficiency η of p+−n diodes due to fluctuation in the surface generation-recombination of carriers

✍ Scribed by A. van Der Ziel; Y. Lin; L. He; A.D. van Rheenen

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 60 KB
• Volume: 33
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(90)90147-7