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A tutorial on built-in self-test. I. Principles

✍ Scribed by Agrawal, V.D.; Kime, C.R.; Saluja, K.K.

Book ID: 118260458
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 1020 KB
Volume: 10
Category: Article
ISSN: 0740-7475
DOI: 10.1109/54.199807

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