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On Built-In Self-Test for Adders

✍ Scribed by Mary D. Pulukuri; Charles E. Stroud

Publisher
Springer US
Year
2009
Tongue
English
Weight
113 KB
Volume
25
Category
Article
ISSN
0923-8174

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## Abstract The self‐test of built‐in RAMs is an excellent method to simplify the testing of VLSI. This paper considers the built‐in self‐test using the linear feedback shift registers on the pseudorandom input generator and the output signature analyzer. It is demonstrated that the method is usefu