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Theoretical properties of LFSRs for built-in self test

✍ Scribed by Christian Dufaza


Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
176 KB
Volume
25
Category
Article
ISSN
0167-9260

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## Abstract The self‐test of built‐in RAMs is an excellent method to simplify the testing of VLSI. This paper considers the built‐in self‐test using the linear feedback shift registers on the pseudorandom input generator and the output signature analyzer. It is demonstrated that the method is usefu