A technique for the determination of the thickness of TEM foils
โ Scribed by R.J. Chester
- Publisher
- Elsevier Science
- Year
- 1985
- Weight
- 458 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-0800
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๐ SIMILAR VOLUMES
We discuss measurement of the local thickness t of a transmission microscope specimen from the log-ratio formula t = h In (It&) where It and I0 are the total and zero-loss areas under the electron-energy loss spectrum. We have measured the total inelastic mean free path h in 11 materials of varying
In modelling transmission electron microscopy (TEM) images with the dynamical theory of electron diffraction, the sample thickness at the region of interest must be accurately known. A technique of sample preparation for cross-sectional single-crystal samples has been developed to provide this infor