Applications of the FIB lift-out techniq
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Giannuzzi, Lucille A.; Drown, Jennifer L.; Brown, Steve R.; Irwin, Richard B.; S
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Article
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1998
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John Wiley and Sons
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English
โ 449 KB
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A site-specific technique for cross-section transmission electron microscopy specimen preparation of difficult materials is presented. A focused ion beam was used to slice an electron transparent membrane from a specific area of interest within a bulk sample. Micromanipulation lift-out procedures we