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A synthesis for testability scheme for finite state machines using clock control

โœ Scribed by Einspahr, K.L.; Mehta, S.K.; Seth, S.C.


Book ID
119778569
Publisher
IEEE
Year
1999
Tongue
English
Weight
387 KB
Volume
18
Category
Article
ISSN
0278-0070

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A test methodology for finite state mach
โœ Hyoung B. Min; William A. Rogers ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer US ๐ŸŒ English โš– 876 KB

This paper presents an efficient automatic test pattern generation technique for loop-free circuits. A partial scan technique is used to convert a sequential circuit (finite state machine) with arbitrary feedback paths into a pipelined circuit for testing. Test generation for these modified circuits