A cost-effective design for testability: clock line control and test generation using selective clocking

✍ Scribed by Sanghyeon Baeg; Rogers, W.A.

• Book ID: 119778477
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 258 KB
• Volume: 18
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.766732