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A Study of the Correlation Between High-Frequency Noise and Phase Noise in Low-Noise Silicon-Based Transistors

✍ Scribed by Cibiel, G.; Escotte, L.; Llopis, O.

Book ID: 126683667
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 499 KB
Volume: 52
Category: Article
ISSN: 0018-9480
DOI: 10.1109/TMTT.2003.821271

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