✦ LIBER ✦

A study of dynamic SIMS analysis of low-k dielectric materials

✍ Scribed by Ian A. Mowat; Xue-Feng Lin; Thomas Fister; Marius Kendall; Gordon Chao; Ming Hong Yang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SIMS studies of low-K materials

✍ Xue-Feng Lin; Stephen P. Smith 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 469 KB

Analysis of surface contamination on org

✍ D. Lu; R. Kumar; C.-K. Chang; A.-Y. Du; T.K.S. Wong 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 309 KB

ToF-SIMS and AFM studies of low-k dielec

✍ P. Lazzeri; X. Hua; G. Oehrlein; E. Iacob; M. Barozzi; M. Bersani; M. Anderle 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 230 KB

Nano-indentation studies of xerogel and

✍ A. K. Sikder; I. M. Irfan; Ashok Kumar; J. M. Anthony 📂 Article 📅 2001 🏛 Springer US 🌐 English ⚖ 588 KB

Characterization of LED materials using

✍ P. Peres; A. Merkulov; S.Y. Choi; F. Desse; M. Schuhmacher 📂 Article 📅 2012 🏛 John Wiley and Sons 🌐 English ⚖ 181 KB

Dynamic dielectric analysis of solids

✍ R. Nottenburg; K. Rajeshwar; M. Freeman; J. Dubow 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 851 KB