## Thin Film Diffusion Studied hy High Temperature Electron Probe Microanalysis nr(lic+nt,rrl to h"frssor Ot,t,n R R l i M M E R on thc. occasion of his 65th \)irthdny Diffiisiori i n Thin Film Systrms (TFS) can lie sttidir(1 effectively by means of Electron Probe Microanalysis (EPMA). Using t i h
A Study of Diffusion by High-temperature Electron Probe Microanalysis
✍ Scribed by Dr.-Ing. P. Gorfu; Prof. Dr. rer. nat. habil. G. Blasek; Dr. Rer. nat. Habil. S. Däbritz
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 399 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0232-1300
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