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A structural and compositional analysis of a TiOxdiffusion barrier for indium tin oxide/Si contacts

โœ Scribed by Young-Woo Ok; Won-Kyu Park; Hyun-Mi Kim; Ki-Bum Kim; Donghwan Kim

Book ID
111857144
Publisher
TechnoPress
Year
2008
Tongue
English
Weight
692 KB
Volume
14
Category
Article
ISSN
1598-9623

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