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[IEEE 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm 2012) - Portland, OR, USA (2012.09.23-2012.09.26)] 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm) - A Study of Contact Endurance Switching Life as a Function of Contact Bond Quality, Contact Electrical Load and Residual Stresses for Silver Tin Indium Oxide Composite Rivet Contacts

✍ Scribed by Chen, Z. K.; Witter, G. J.

Book ID: 120293810
Publisher: IEEE
Year: 2012
Weight: 915 KB
Category: Article
ISBN: 1467307807
DOI: 10.1109/HOLM.2012.6336601

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