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A STM/STS and XPS study of oxidized metal powders

✍ Scribed by Bernhard A. Kwetkus; Klaus Sattler


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
644 KB
Volume
42-44
Category
Article
ISSN
0304-3991

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XPS and x-ray-induced AES have been used to study the reaction layers formed on silicon powder samples heated in ultra-high purity nitrogen at temperatures between 1100 and 1200 "C. An equation was derived to calculate the average surface reaction layer thicknesses from the silicon AES spectra. The